Mike Lange is the detector specialist. Mr. Lange obtained his B.S. in Chemical Engineering from Renssalaer Polytechnic Institute, with an emphasis on Chemistry of Microelectronics and an M.E. in Electrical Engineering from Princeton University. He has over 35 years of experience in Semiconductor Device Fabrication. He is a pioneer in InP/InGaAs fabrication technology with over 30 years in the field.
Through the mid 1980’s, Mr. Lange helped develop many of the standard techniques currently being used to manufacture high quality, production grade InGaAs based photonic devices while employed at Epitaxx. He was Director of Fabrication Technology at Sensors Unlimited/Finisar/Goodrich Corp. where he designed and improved manufacturing fabrication processes for a variety of opto-electronic components including APDs, High-Speed PINs, NIR spectroscopy arrays, NIR imaging arrays, lasers and JFETs.
Mike has extensive knowledge of many aspects of III-V semiconductor, Ge and SiC device fabrication and packaging technology. He has been responsible for device design, optimizing fabrication techniques, and has assembled six different clean-room foundries. These fabrication facilities have produced well over $750M of opto-electronic devices over the past 30 years. He holds several patents for InGaAs device inventions and has published several technical papers. Mr. Lange joined the PRISM staff at Princeton University in early 2008 as Engineer-in-Residence where he helped support the micro/nanofabrication facility and interact with all PRISM corporate members. Besides InP/inGaAs materials, Mr. Lange’s experience in semiconductor devices also includes Germanium, Silicon, Silicon Carbide, Gallium Arsenide, Indium Antimonide, and Organic Semiconductors. In 2009 Mr. Lange became a general partner in United Silicon Carbide Inc. which fabricates a variety of high power electronic SiC devices. He joined Princeton Infrared Technologies in 2013 as Detector Specialist where he designs Detector Arrays and manages the manufacture of these critical components used for NIR imaging.